Retrospective Exposure Assessment for Semiconductor and Storage Device Manufacturing Facilities
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DOI: 10.1097/jom.0000000000001544
Abstract: Objective: The aim of this study was to develop exposure estimates for a case–control study of central nervous system cancer in semiconductor and storage device manufacturing workers. Methods: Over 700,000 records on sample measurements were… read more here.
Keywords: exposure; storage device; device manufacturing; semiconductor storage ... See more keywords