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Published in 2019 at "Advanced Electronic Materials"
DOI: 10.1002/aelm.201800964
Abstract: Organic ternary resistive memories can greatly improve the information density and thus are being extensively explored. However, the effective ternary device yield remains too low (usually
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Keywords:
surface engineering;
yield;
device yield;
spiro ometad ... See more keywords
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Published in 2019 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2018.10.023
Abstract: Abstract Correlation between morphological defects and device yield in the 4H-SiC epitaxial layers were investigated with overlapped morphological defect mapping and device yield mapping figures. The results show the harmful level of various morphological defects…
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Keywords:
triangular defects;
sic epitaxial;
epitaxial layers;
morphological defects ... See more keywords