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Published in 2017 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2016.2630079
Abstract: For the first time, we present the electrostatic discharge (ESD) behavior of grounded gate tunnel FET (ggTFET) with detailed physical insight into the device operation, 3-D filamentation and failure under ESD stress conditions. Current as…
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Keywords:
esd behavior;
tunnel fet;
devices esd;
device ... See more keywords