Statistical CSI-Enabled Optimization for Beyond Diagonal SIM
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DOI: 10.1109/lwc.2025.3584817
Abstract: Stacked intelligent metasurfaces (SIM) represent an innovative design comprising multiple metasurface layers, enabling complex signal processing tasks directly in the wave domain. This paradigm not only enhances signal processing efficiency but also reduces hardware costs.… read more here.
Keywords: beyond diagonal; statistical csi; signal processing; diagonal sim ... See more keywords