Scattered field from a dielectric-topological insulator rough interface using perturbation theory
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DOI: 10.1016/j.optcom.2019.124958
Abstract: Abstract Scattering from a dielectric-topological insulator (TI) rough interface is studied using perturbation theory (PT). Two models characterized by magneto-electric pseudo scalar ψ and surface admittance γ for TI material are incorporated in the analysis.… read more here.
Keywords: rough interface; field; insulator rough; dielectric topological ... See more keywords