Investigation of Plane Defects in a Dielectric Wafer by Spectral-Domain Integral Equation Method
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DOI: 10.1007/s10598-016-9345-y
Abstract: The spectral-domain volume integral equation is used to develop a computer model for investigating the scattering properties of plane objects in the form of elliptical cylinders embedded in a dielectric wafer. The features of the… read more here.
Keywords: dielectric wafer; integral equation; spectral domain; plane ... See more keywords