Investigation on de-trapping mechanisms related to non-monotonic kink pattern in GaN HEMT devices
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DOI: 10.1063/1.4985057
Abstract: This article reports an experimental approach to analyze the kink effect phenomenon which is usually observed during the GaN high electron mobility transistor (HEMT) operation. De-trapping of charge carriers is one of the prominent reasons… read more here.
Keywords: different trapping; trapping mechanisms; hemt; non monotonic ... See more keywords