Articles with "differential electron" as a keyword



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Differential electron yield imaging with STXM.

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Published in 2020 at "Ultramicroscopy"

DOI: 10.1016/j.ultramic.2020.113198

Abstract: Total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental composition, and electrical conductivity. However, the TEY-STXM signal is determined solely… read more here.

Keywords: differential electron; stxm; yield imaging; electron yield ... See more keywords