Micro-diffraction Investigation of Localized Strain in Mesa-etched HgCdTe Photodiodes
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DOI: 10.1007/s11664-017-5691-6
Abstract: We present an x-ray micro-diffraction investigation of localized strain and lattice disorientation in HgCdTe layers with a submicronic resolution using a synchrotron white beam in Laue configuration. Diffraction peak displacement mapping evidences bending of the… read more here.
Keywords: diffraction investigation; localized strain; mesa etched; diffraction ... See more keywords