Measurement of coating thickness with X-ray diffraction
Sign Up to like & getrecommendations! Published in 2023 at "Powder Diffraction"
DOI: 10.1017/s088571562300012x
Abstract: X-ray fluorescence (XRF) is frequently used to measure layer thickness in the micrometer range. But also X-ray diffraction (XRD) can be used in a comparable way and offers the benefit to differentiate coating layers by… read more here.
Keywords: coating thickness; ray diffraction; diffraction measurement; diffraction ... See more keywords
Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages1
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Applied Crystallography"
DOI: 10.1107/s1600576717003132
Abstract: X-ray diffraction imaging in both monochromatic and white beam section mode has been used to measure quantitatively the displacement and warpage stress in encapsulated silicon devices. read more here.
Keywords: ray diffraction; diffraction measurement; warpage; nondestructive ray ... See more keywords