Characterization of radiation effects in 65 nm digital circuits with the DRAD digital radiation test chip
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DOI: 10.1088/1748-0221/12/02/c02039
Abstract: A Digital RADiation (DRAD) test chip has been specifically designed to study the impact of Total Ionizing Dose (TID) ( read more here.
Keywords: test chip; digital radiation; characterization radiation; test ... See more keywords