Probing interlayer van der Waals strengths of two-dimensional surfaces and defects, through STM tip-induced elastic deformations
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DOI: 10.1088/1361-6528/acb442
Abstract: A methodology to test the interlayer bonding strength of two-dimensional (2D) surfaces and associated one (1D)- and two (2D)- dimensional surface defects using scanning tunneling microscope tip-induced deformation, is demonstrated. Surface elastic deformation characteristics of… read more here.
Keywords: van der; two dimensional; der waals; interlayer ... See more keywords