Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films
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DOI: 10.1002/admi.201601011
Abstract: Topological crystalline insulators (TCIs) are new materials with metallic surface states protected by crystal symmetry. The properties of molecular beam epitaxy grown SnTe TCI on SrTiO3(001) are investigated using scanning tunneling microscopy (STM), noncontact atomic… read more here.
Keywords: topological crystalline; microscopy; dimensionality defects; scale dimensionality ... See more keywords