Ellipsometric study of the electronic behaviors of titanium-vanadium dioxide (TixV1−xO2) films for 0 ≤ x ≤ 1 during semiconductive-to-metallic phase transition
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DOI: 10.1063/5.0029279
Abstract: Titanium-vanadium dioxide or TixV1−xO2 films for 0 ≤ x ≤ 1 were examined using ellipsometry, and their optical constants (n and k) at visible and near-infrared wavelengths were determined at temperatures (T) below, at, and above the… read more here.
Keywords: transition; xo2 films; tixv1 xo2; vanadium dioxide ... See more keywords