The evaluation of surface topography changes in nanoscaled 2,6‐diphenyl anthracene thin films by atomic force microscopy
Sign Up to like & getrecommendations! Published in 2020 at "Microscopy Research and Technique"
DOI: 10.1002/jemt.23569
Abstract: The physical properties of electronic devices made by 2,6‐diphenyl anthracene (DPA) are influenced by the microtexture of DPA surfaces. This work focused on the experimental investigation of the 3‐D surface microtexture of DPA thin films… read more here.
Keywords: topography; thin films; microscopy; force microscopy ... See more keywords
Topographic characterization of thin film field-effect transistors of 2,6-diphenyl anthracene (DPA) by fractal and AFM analysis
Sign Up to like & getrecommendations! Published in 2018 at "Materials Science in Semiconductor Processing"
DOI: 10.1016/j.mssp.2018.02.008
Abstract: Abstract Presented article is aimed at experimental investigation of the scalable nature of the 3-D surface micromorphology of 2,6-diphenyl anthracene (DPA). Films under study were evaporated in vacuum chamber on various substrates. The surfaces of… read more here.
Keywords: anthracene dpa; diphenyl anthracene; analysis; topographic characterization ... See more keywords