A discrete spatial model for wafer yield prediction
Sign Up to like & getrecommendations! Published in 2018 at "Quality Engineering"
DOI: 10.1080/08982112.2017.1328063
Abstract: ABSTRACT Yield analysis is one of the key concerns in the fabrication of semiconductor wafers. An effective yield analysis model will contribute to production planning and control, cost reductions and the enhanced competitiveness of enterprises.… read more here.
Keywords: wafer yield; model wafer; model; yield ... See more keywords
Generation and characterization of discrete spatial entanglement in multimode nonlinear waveguides
Sign Up to like & getrecommendations! Published in 2017 at "Physical Review A"
DOI: 10.1103/physreva.95.032322
Abstract: We analyze theoretically spontaneous parametric down-conversion in a multimode nonlinear waveguide as a source of entangled pairs of spatial qubits, realized as superpositions of a photon in two orthogonal transverse modes of the waveguide. It… read more here.
Keywords: multimode nonlinear; multimode; spatial entanglement; generation characterization ... See more keywords