Statistical analysis of dislocations and dislocation boundaries from EBSD data.
Sign Up to like & getrecommendations! Published in 2017 at "Ultramicroscopy"
DOI: 10.1016/j.ultramic.2017.04.005
Abstract: Electron BackScatter Diffraction (EBSD) is often used for semi-quantitative analysis of dislocations in metals. In general, disorientation is used to assess Geometrically Necessary Dislocations (GNDs) densities. In the present paper, we demonstrate that the use… read more here.
Keywords: disorientation; ebsd data; dislocation boundaries; analysis dislocations ... See more keywords