Robust Dislocation Defects Region Segmentation for Polysilicon Wafer Image With Random Texture Background
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DOI: 10.1109/access.2019.2942218
Abstract: The detection of dislocation defects in polysilicon wafers helps to improve the power generation efficiency and service life of solar cells. However, dislocation defect detection is challenging due to similarity of morphology and intensity between… read more here.
Keywords: region; dislocation defects; dislocation; background ... See more keywords