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Published in 2021 at "Nanoscale"
DOI: 10.1039/d1nr05107e
Abstract: Ferroelectric field-effect transistors (FeFETs) with a single gate structure and using the newly discovered ferroelectric hafnium oxide as an active material are attracting considerable interest for nonvolatile memory devices. However, such FeFETs struggle to achieve…
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Keywords:
memory window;
double gate;
free read;
disturb free ... See more keywords