The Study on Single-Event Effects and Hardening Analysis of Frequency Divider Circuits Based on InP HBT Process
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DOI: 10.3390/mi15040527
Abstract: The single-event effects (SEEs) of frequency divider circuits and the radiation tolerance of the hardened circuit are studied in this paper. Based on the experimental results of SEEs in InP HBTs, a transient current model… read more here.
Keywords: single event; divider circuits; divider; event effects ... See more keywords