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Published in 2019 at "IEEE Access"
DOI: 10.1109/access.2018.2883776
Abstract: Existing mutation techniques generate vast numbers of equivalent and trivial mutants, which do not contribute on the improvement of test quality. One possible solution, as is proposed in this paper, is to measure the difficulty…
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Keywords:
analysis technique;
rip analysis;
domain rip;
analysis ... See more keywords