Compact Modeling of MOSFET $I$ – $V$ Characteristics and Simulation of Dose-Dependent Drain Currents
Sign Up to like & getrecommendations! Published in 2017 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2017.2712284
Abstract: We have presented a compact MOSFET model, which allows us to describe the current–voltage characteristics of irradiated long-channel and short-channel transistors in all operation modes at different measurement temperatures and interface trap densities. The model… read more here.
Keywords: mosfet; model; compact modeling; simulation ... See more keywords