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Published in 2020 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2020.113656
Abstract: Abstract The characterization of commercial-grade power transistors upon high levels of particle irradiation is required to enable radiation tolerant LED power supplies for the new luminaires of CERN accelerator tunnels, which represent a harsh environment…
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Keywords:
irradiation;
hybrid drain;
gan hybrid;
embedded gate ... See more keywords