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Published in 2018 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2018.2833057
Abstract: Proper driving of a large-area, high-resolution, and high-frame-rate active-matrix display can be hindered by excessive delay along a signal path, such as a scan line. Depending on the transistor architecture, such delay could be dominated…
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Keywords:
drain regions;
bottom gate;
self aligned;
gate ... See more keywords
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1
Published in 2018 at "Micromachines"
DOI: 10.3390/mi9120657
Abstract: Currently, a tunnel field-effect transistor (TFET) is being considered as a suitable electrostatic discharge (ESD) protection device in advanced technology. In addition, silicon-germanium (SiGe) engineering is shown to improve the performance of TFET-based ESD protection…
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Keywords:
drain regions;
esd protection;
source drain;
tfet ... See more keywords