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Published in 2023 at "Advanced Materials"
DOI: 10.1002/adma.202210554
Abstract: Severe power consumption in the continuous scaling of Silicon‐based dynamic random access memory (DRAM) technology quests for a transistor technology with a much lower off‐state leakage current. Wide bandgap amorphous oxide semiconductors, especially indium‐gallium‐zinc‐oxide (IGZO)…
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Keywords:
high speed;
speed dram;
true nonvolatile;
dram ... See more keywords