Modeling of Statistical Variation Effects on DRAM Sense Amplifier Offset Voltage
Sign Up to like & getrecommendations! Published in 2021 at "Micromachines"
DOI: 10.3390/mi12101145
Abstract: With the downscaling in device sizes, process-induced parameter variation has emerged as one of the most serious problems. In particular, the parameter fluctuation of the dynamic random access memory (DRAM) sense amplifiers causes an offset… read more here.
Keywords: voltage; offset voltage; sense amplifier; statistical variation ... See more keywords