Thickness estimation of the silica-like thin layers via swelling-driven wrinkling instability
Sign Up to like & getrecommendations! Published in 2020 at "Thin Solid Films"
DOI: 10.1016/j.tsf.2020.137812
Abstract: Abstract In the present study, we report a simple, yet facile route to thickness characterization of the UV/ozone (UVO) treated polydimethylsiloxane (PDMS) thin layer via osmotically-driven wrinkling instability. Through the UVO oxidation process of PDMS,… read more here.
Keywords: wrinkling instability; pdms; silica like; driven wrinkling ... See more keywords