Removing the influence of the angle of incidence in a dual rotating retarder Mueller matrix polarimeter.
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DOI: 10.1364/ao.435283
Abstract: Due to the sensitivity of wave plates to the angle of incidence (AOI) of light, the accuracy of a dual rotating retarder Mueller matrix polarimeter is also influenced by the AOI. Unlike other conventional systematic… read more here.
Keywords: mueller; influence; mueller matrix; dual rotating ... See more keywords