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Published in 2018 at "IEEE Access"
DOI: 10.1109/access.2017.2782088
Abstract: An electrostatic discharge (ESD) event can cause a medical device to fail and pose a threat to patients’safety. This paper presents the data mining analysis of ESD failures in medical devices, over the last ten…
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Keywords:
devices due;
electrostatic occurrences;
analysis;
due electrostatic ... See more keywords
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Published in 2020 at "IEEE Transactions on Electromagnetic Compatibility"
DOI: 10.1109/temc.2018.2890704
Abstract: In this paper, we present a methodology to characterize the I/O pins of a logic IC such as an application processor or ASIC with respect to soft-failure susceptibility due to electrostatic discharge. With the IC…
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Keywords:
due electrostatic;
methodology;
failure susceptibility;
electrostatic discharge ... See more keywords