LAUSR

Dynamic Write VMIN and Yield Estimation for Nanoscale SRAMs

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1 Published in 2021 at "IEEE Transactions on Circuits and Systems I: Regular Papers"

DOI: 10.1109/tcsi.2021.3110484

Abstract: The dynamic write-access operation in an SRAM has a long-tailed distribution that sets the threshold for write-access failures. The distribution takes a long time to evaluate since rare failure events lie in its long and… read more here.

Keywords: vmin yield; write access; yield estimation; write vmin ... See more keywords