Nanobeam X-ray Fluorescence Dopant Mapping Reveals Dynamics of in Situ Zn-Doping in Nanowires.
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DOI: 10.1021/acs.nanolett.8b02957
Abstract: The properties of semiconductors can be controlled using doping, making it essential for electronic and optoelectronic devices. However, with shrinking device sizes it becomes increasingly difficult to quantify doping with sufficient sensitivity and spatial resolution.… read more here.
Keywords: situ doping; ray fluorescence; dynamics situ; mapping ... See more keywords