The Spatial Resolution Limit for an Individual Domain Wall in Magnetic Nanowires.
Sign Up to like & getrecommendations! Published in 2017 at "Nano letters"
DOI: 10.1021/acs.nanolett.7b03199
Abstract: Magnetic nanowires are the foundation of several promising nonvolatile computing devices, most notably magnetic racetrack memory and domain wall logic. Here, we determine the analog information capacity in these technologies, analyzing a magnetic nanowire containing… read more here.
Keywords: magnetic nanowires; edge roughness; domain wall; resolution limit ... See more keywords
Study of line edge roughness on various types of gate-all-around field effect transistor
Sign Up to like & getrecommendations! Published in 2019 at "Semiconductor Science and Technology"
DOI: 10.1088/1361-6641/ab52e4
Abstract: The impact of Line Edge Roughness (LER) on Gate-All-Around FETs (GAAFETs) with various channel types is investigated. Among various channel types of GAAFET, (i) nanowire (NW), (ii) nanosheet (NS), and (iii) stacked channel are investigated.… read more here.
Keywords: gaafet; edge roughness; effect; channel gaafet ... See more keywords
Voltage-Controlled Energy-Efficient Domain Wall Synapses With Stochastic Distribution of Quantized Weights in the Presence of Thermal Noise and Edge Roughness
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2021.3111846
Abstract: We propose energy-efficient voltage-induced strain control of a domain wall (DW) in a perpendicularly magnetized nanoscale racetrack on a piezoelectric substrate that can implement a multistate synapse to be utilized in neuromorphic computing platforms. Here,… read more here.
Keywords: edge roughness; domain wall; energy efficient; thermal noise ... See more keywords
Quantitative analysis and modeling of line edge roughness in near-field lithography: toward high pattern quality in nanofabrication
Sign Up to like & getrecommendations! Published in 2019 at "Nanophotonics"
DOI: 10.1515/nanoph-2019-0031
Abstract: Abstract Quantitative analysis of line edge roughness (LER) is very important for understanding the root causes of LER and thereby improving the pattern quality in near-field lithography (NFL), because LER has become the main limiter… read more here.
Keywords: quality; quantitative analysis; near field; edge roughness ... See more keywords
High-Resolution Structure-from-Motion for Quantitative Measurement of Leading-Edge Roughness
Sign Up to like & getrecommendations! Published in 2020 at "Energies"
DOI: 10.3390/en13153916
Abstract: Over time, erosion of the leading edge of wind turbine blades increases the leading-edge roughness (LER). This may reduce the aerodynamic performance of the blade and hence the annual energy production of the wind turbine.… read more here.
Keywords: resolution; high resolution; leading edge; edge roughness ... See more keywords
Impact of Leading Edge Roughness in Cavitation Simulations around a Twisted Foil
Sign Up to like & getrecommendations! Published in 2020 at "Fluids"
DOI: 10.3390/fluids5040243
Abstract: The simulation of fully turbulent, three-dimensional, cavitating flow over Delft twisted foil is conducted by an implicit large eddy simulation (LES) approach in both smooth and tripped conditions, the latter by including leading-edge roughness. The… read more here.
Keywords: cavitation; foil; leading edge; edge roughness ... See more keywords