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Published in 2023 at "Small"
DOI: 10.1002/smll.202205800
Abstract: The ability to control the density and spatial distribution of substitutional dopants in semiconductors is crucial for achieving desired physicochemical properties. Substitutional doping with adjustable doping levels has been previously demonstrated in 2D transition metal dichalcogenides…
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Keywords:
substitutional dopants;
control;
distribution;
edge termination ... See more keywords
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Published in 2020 at "Journal of Computational Electronics"
DOI: 10.1007/s10825-020-01553-y
Abstract: A novel edge-termination concept using extreme permittivity dielectrics is proposed to effectively manage electric fields in vertical power-devices. This method is expected to be particularly significant for wide band-gap semiconductors, where field termination is a…
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Keywords:
high permittivity;
permittivity dielectric;
termination;
edge termination ... See more keywords
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1
Published in 2018 at "Superlattices and Microstructures"
DOI: 10.1016/j.spmi.2018.10.018
Abstract: Abstract SiC MOSFET with three-section edge termination is investigated in this paper. The edge termination for SiC MOSFET is divided into three sections with different field limited rings and the space between rings, which benefits…
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Keywords:
sic mosfet;
mosfet three;
edge termination;
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1
Published in 2020 at "IEEE Photonics Technology Letters"
DOI: 10.1109/lpt.2020.3025290
Abstract: In this letter, a beveled-mesa edge termination technology was developed to improve the performance of GaN p-i-n ultraviolet avalanche photodiodes (APDs). Simulation results showed that the beveled-mesa is effective in reduction of the electric field…
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Keywords:
beveled mesa;
apds;
mesa edge;
edge termination ... See more keywords
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1
Published in 2020 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2020.2992577
Abstract: An edge termination structure with enhanced field-limiting rings (enhanced FLRs) is proposed to stabilize the breakdown voltage against the surface charge. The pitches of the enhanced rings are designed to mitigate the electric field and…
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Keywords:
voltage;
field;
edge termination;
surface charge ... See more keywords
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1
Published in 2020 at "Semiconductors"
DOI: 10.1134/s1063782620020153
Abstract: The prospects for the protection of high-voltage 4H-SiC-devices from edge breakdown via the formation of mesa structures with inclined walls (negative beveling) are considered. Numerical simulation of the spatial electric-field distribution in high-voltage (~1500V) reverse-biased…
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Keywords:
high voltage;
sic devices;
negative beveling;
edge termination ... See more keywords