Aberration-Corrected STEM/EELS at Cryogenic Temperatures
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DOI: 10.1017/s1431927617002823
Abstract: Today’s aberration-corrected scanning transmission electron microscopes (STEM) routinely focus highenergy electrons down to a spot smaller than 1Å in diameter to perform scattering experiments that allow us to study the atomic-scale structure of materials and… read more here.
Keywords: aberration; corrected stem; cryogenic temperatures; aberration corrected ... See more keywords