Effects of Interface Oxidation on Noise Properties and Performance in III–V Vertical Nanowire Memristors
Sign Up to like & getrecommendations! Published in 2023 at "ACS Applied Materials & Interfaces"
DOI: 10.1021/acsami.2c21669
Abstract: Memristors implemented as resistive random-access memories (RRAMs) owing to their low power consumption, scalability, and speed are promising candidates for in-memory computing and neuromorphic applications. Moreover, a vertical 3D implementation of RRAMs enables high-density crossbar… read more here.
Keywords: effects interface; noise; noise properties; interface oxidation ... See more keywords
Effects of Interface States on Ge-On-SOI Photodiodes
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Journal of the Electron Devices Society"
DOI: 10.1109/jeds.2018.2872037
Abstract: The 4.2% mismatch at the Si/Ge interface has a significant impact on Si/Ge photodetectors. However, few researchers have attempted to determine the major noise source or study the effects of the Si/Ge interface on the… read more here.
Keywords: tex math; interface states; inline formula; effects interface ... See more keywords