Radiation effects and reliability characteristics of Ge pMOSFETs
Sign Up to like & getrecommendations! Published in 2019 at "Microelectronic Engineering"
DOI: 10.1016/j.mee.2019.111034
Abstract: Abstract Germanium (Ge) is a promising channel material to replace silicon (Si) for the sub-10 nm CMOS technology node. However, the realization of Ge-based MOSFET may be limited by its poor reliability characteristics. In addition, radiation… read more here.
Keywords: radiation effects; radiation; effects reliability; radiation exposure ... See more keywords
Ageing: Causes and Effects on the Reliability of Polypropylene Film Used for HVDC Capacitor
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DOI: 10.1109/access.2020.2976526
Abstract: It is well-known that the high-performance polymeric dielectric films used for high-voltage DC capacitors should have outstanding capabilities in terms of electrical and mechanical properties in order to face harsh operating conditions. Many factors limit… read more here.
Keywords: reliability polypropylene; ageing causes; polypropylene; effects reliability ... See more keywords