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Published in 2023 at "Small"
DOI: 10.1002/smll.202206550
Abstract: Current electrical contact models are occasionally insufficient at the nanoscale owing to the wide variations in outcomes between 2D mono and multi-layered and bulk materials that result from their distinctive electrostatics and geometries. Contrarily, devices… read more here.
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Published in 2017 at "Carbon"
DOI: 10.1016/j.carbon.2017.02.091
Abstract: Abstract The quality of the electrical contact between the specimen and electromagnetic interference (EMI) shielding testing fixture (coaxial cable method) is found to be critical to shielding effectiveness testing. The carbon fiber (CF) mat (0.15–0.42 mm… read more here.
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Published in 2018 at "Journal of Alloys and Compounds"
DOI: 10.1016/j.jallcom.2018.01.326
Abstract: Abstract Cu-based composites are considered as one of the high performance and cost-effective materials to replace the noble metal-based electrical contact materials used in low-voltage electrical apparatus. However, the oxidation resistance of Cu-based electrical contact… read more here.
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Published in 2019 at "Journal of Alloys and Compounds"
DOI: 10.1016/j.jallcom.2019.01.083
Abstract: Abstract Equal channel angular pressing (ECAP) was introduced firstly to prepare Ag/Ti3AlC2 electrical contact materials. Ag/10 wt% Ti3AlC2 composite with a relative density of 99.8% and refined microstructure was prepared by ECAP at a relatively low… read more here.
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Published in 2021 at "Materials Letters"
DOI: 10.1016/j.matlet.2021.130504
Abstract: Abstract The electrical contact resistance of a Ag/carbon nanotube (CNT) composite plating film prepared using a cyanide-free bath was evaluated against a H2S gas corrosion test. After the corrosion test, the Ag/CNT composite plating film… read more here.
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Published in 2018 at "Measurement"
DOI: 10.1016/j.measurement.2018.07.030
Abstract: Abstract Research on the methodology for predicting and analyzing the performance of a thermoelectric device (TED) can offer various possibilities for enhancing its energy conversion characteristics. In this work, the methodology to determine the electrical… read more here.
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Published in 2021 at "Materials Science in Semiconductor Processing"
DOI: 10.1016/j.mssp.2020.105470
Abstract: Abstract Vertical silicon nano-pillars (Si N-Pls) inside the cylindrical trenches have been fabricated as a prospective platform for the development of silicon nanowire based devices. Deep reactive ion etching (DRIE) has been used to etch… read more here.
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Published in 2017 at "Wear"
DOI: 10.1016/j.wear.2016.12.033
Abstract: Abstract Electronic connectors are extensively used in the car industry. However, due to engine vibration, fretting wear damage can decay the electrical contact resistance. In addition to small fretting oscillations, the connectors are subjected to… read more here.
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Published in 2017 at "Nano letters"
DOI: 10.1021/acs.nanolett.7b02938
Abstract: Electrical contact to low-dimensional (low-D) materials is a key to their electronic applications. Traditional metal contacts to low-D semiconductors typically create gap states that can pin the Fermi level (EF). However, low-D metals possessing a… read more here.
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Published in 2022 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.2c02096
Abstract: Control of work function (WF) in graphene is crucial for graphene application in electrode material replacement and electrode surface protection in optoelectronic devices. Although efforts have been made to manipulate the effective WF of graphene… read more here.
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Published in 2020 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.9b21996
Abstract: Field-effect transistors derived from traditional 3D semiconductors are rapidly approaching their fundamental limits. Layered semiconducting materials have emerged as promising candidates to replace restrictive 3D semiconductor materials. However, contacts between metals and layered materials deviate… read more here.