Switch-OFF Avalanche-Breakdown-Induced Electrical Degradations of RF-LDMOS Transistor for SMPAs Applications
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DOI: 10.1109/ted.2018.2860948
Abstract: The electrical parameters degradations of a radio frequency lateral-diffused metal–oxide–semiconductor transistor under switch-OFF avalanche breakdown stress have been first experimentally investigated. A modified three-port dc-IV method is proposed to demonstrate the degradation mechanisms. It shows… read more here.
Keywords: induced electrical; avalanche breakdown; switch avalanche; electrical degradations ... See more keywords