Dielectric properties, electrical modulus and current transport mechanisms of Au/ZnO/n-Si structures
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DOI: 10.1016/j.pnsc.2018.05.003
Abstract: Abstract Au/ZnO/n-Si (MIS) structures were fabricated by using the RF sputtering method and their complex dielectric constant (e*=e’-je’’), electric modulus (M*=M′+ jM’’) and electrical conductivity (σ = σdc+σac) values were investigated as a function of frequency (0.7 kHz-1 MHz)… read more here.
Keywords: properties electrical; voltage; dielectric properties; electrical modulus ... See more keywords