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Published in 2024 at "Advanced Materials"
DOI: 10.1002/adma.202313254
Abstract: Small defects induce concentrated electrical stress in dielectric polymers, leading to premature failure of materials. Existing sensing methods fail to effectively visualize these defects owing to the invisible‐energy state of the electric field. Thus, it…
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Keywords:
visualization;
inspired noctiluca;
noctiluca scintillans;
stress ... See more keywords
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Published in 2018 at "Composites Science and Technology"
DOI: 10.1016/j.compscitech.2017.11.026
Abstract: Abstract The effect of electrical stress on glass fiber reinforced polymer under wet condition has been investigated in the present study. A specially designed and fabricated test setup was used through which the current passing…
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Keywords:
effect electrical;
stress glass;
electrical stress;
gfrp ... See more keywords
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Published in 2024 at "Applied Physics Letters"
DOI: 10.1063/5.0204051
Abstract: Degradation and trap evolution in NiO/β-Ga2O3 heterojunction pn diodes under on-state electrical stress were investigated in this work using deep-level transient spectroscopy measurements and density functional theory (DFT) calculations. The decrease in turn-on voltage and…
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Keywords:
nio ga2o3;
degradation;
stress;
heterojunction diodes ... See more keywords
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Published in 2020 at "Nanotechnology"
DOI: 10.1088/1361-6528/aba86e
Abstract: We present a thorough exploration of nanopore growth under electrical stress in electrolyte solution, and demonstrate that despite their superficial similarities, nanopore formation by controlled breakdown (CBD) and nanopore growth under moderate voltage stress are…
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Keywords:
mechanisms solid;
electrical stress;
stress;
nanopore growth ... See more keywords
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Published in 2019 at "Iranian Journal of Basic Medical Sciences"
DOI: 10.22038/ijbms.2019.29012.7002
Abstract: Objective(s): Impairment of hippocampus function as a center for memory processing occurs due to stress. Centella asiatica L. (Gotu kola) is known to improve memory, intelligence, and neural protection although the precise mechanism is not…
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Keywords:
gotu kola;
kinase;
electrical stress;
stress model ... See more keywords
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Published in 2025 at "Micromachines"
DOI: 10.3390/mi16010102
Abstract: The short-circuit (SC) robustness of SiC MOSFETs is critical for high-power applications, yet 1.2 kV devices often struggle to meet the industry-standard SC withstand time (SCWT) under practical operating conditions. Despite growing interest in higher…
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Keywords:
varying electrical;
performance;
electrical stress;
sic mosfets ... See more keywords