In-Situ Studies toward the Occurrence of “Pseudoelasticity” in Confined Nanostructured NiTi Films and Its Implications toward “Stress Buffering” during Electrochemical Li-Alloying/De-Alloying of Si
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DOI: 10.1021/acsaem.9b01680
Abstract: The combination of in-situ synchrotron X-ray diffraction and in-situ stress measurements performed during electrochemical Li-alloying/-dealloying of amorphous Si (a-Si) films, having ∼150 nm thick ... read more here.
Keywords: studies toward; occurrence pseudoelasticity; electrochemical alloying; stress ... See more keywords