Shell effects and free-electrons in electromigrated oxidized Cu-nanocontacts
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DOI: 10.1088/1361-6528/acb654
Abstract: Electromigration in interconnects continues to be an important field of study in integrated circuits as the interconnects are planned to shrink in size at comparable pace as the semiconductor functional elements. Through shrinking the interconnects… read more here.
Keywords: shell effects; electromigrated oxidized; free electrons; electrons electromigrated ... See more keywords