Articles with "electromigrated oxidized" as a keyword



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Shell effects and free-electrons in electromigrated oxidized Cu-nanocontacts

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Published in 2023 at "Nanotechnology"

DOI: 10.1088/1361-6528/acb654

Abstract: Electromigration in interconnects continues to be an important field of study in integrated circuits as the interconnects are planned to shrink in size at comparable pace as the semiconductor functional elements. Through shrinking the interconnects… read more here.

Keywords: shell effects; electromigrated oxidized; free electrons; electrons electromigrated ... See more keywords