Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges
Sign Up to like & getrecommendations! Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s143192761900953x
Abstract: Metrology of crystalline defects is crucial for the understanding and development of a wide range of novel materials. Hence there is a huge demand from both academia and the semiconductor industry for extended defect characterisation… read more here.
Keywords: microscopy; channelling contrast; electron; electron channelling ... See more keywords
Electron channelling contrast imaging of dislocations in a conventional SEM
Sign Up to like & getrecommendations! Published in 2017 at "Philosophical Magazine"
DOI: 10.1080/14786435.2016.1262971
Abstract: Abstract Dislocations in shock loaded tantalum single crystals were imaged using both transmission electron microscope (TEM) and electron channelling contrast image (ECCI) in a scanning electron microscope with a conventional backscattered electron detector. The results… read more here.
Keywords: contrast imaging; electron channelling; contrast; imaging dislocations ... See more keywords