Analysis of Scanned Probe Images for Magnetic Focusing in Graphene
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DOI: 10.1007/s11664-017-5350-y
Abstract: We have used cooled scanning probe microscopy (SPM) to study electron motion in nanoscale devices. The charged tip of the microscope was raster-scanned at constant height above the surface as the conductance of the device… read more here.
Keywords: electrons away; probe; analysis scanned; magnetic focusing ... See more keywords