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Published in 2018 at "IEEE Transactions on Electron Devices"
DOI: 10.1109/ted.2018.2836387
Abstract: Power consumption of today’s integrated circuit is very difficult to reduce because the MOSFET is subjected to the thermal limit of 60 mV/decade for the subthreshold swing (SS). In this paper, we show that this…
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Keywords:
source breaking;
source;
electrons source;
limit ... See more keywords