Electrostatic tip effects in scanning probe microscopy of nanostructures
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DOI: 10.1088/1361-6528/abde63
Abstract: Electrical scanning probe microscopies (SPM) use ultrasharp metallic tips to obtain nanometer spatial resolution and are a key tool for characterizing nanoscale semiconducting materials and systems. However, these tips are not passive probes; their high… read more here.
Keywords: tip induced; scanning probe; microscopy; electrostatic tip ... See more keywords