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Published in 2022 at "Small"
DOI: 10.1002/smll.202204943
Abstract: A reliable and quantitative material analysis is crucial for assessing new technological processes, especially to facilitate a quantitative understanding of advanced material properties at the nanoscale. To this end, X-ray fluorescence microscopy techniques can offer…
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Keywords:
individual nanoobjects;
sensitive analysis;
analysis individual;
analysis ... See more keywords