A new ellipsometric approach for determining dielectric function of graphene in the infrared spectral region
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DOI: 10.1080/09500340.2016.1229510
Abstract: Abstract Simple ellipsometric method for determining dielectric constants of absorbing two-dimensional materials on dielectric substrates is developed. The method is based on the analytical formulas obtained in the framework of a long-wave limit. An important… read more here.
Keywords: dielectric function; new ellipsometric; approach determining; determining dielectric ... See more keywords