Spectroscopic Ellipsometry of Asphalt Binder: A Study of Optical Constants
Sign Up to like & getrecommendations! Published in 2019 at "International Journal of Civil Engineering"
DOI: 10.1007/s40999-019-00468-5
Abstract: Spectroscopic ellipsometry is a powerful technique for determining optical properties of any thin surface. A method for characterizing optical properties of warm asphalt binder using spectroscopic ellipsometry along with associated results has been presented in… read more here.
Keywords: coefficient; ellipsometry; asphalt binder; spectroscopic ellipsometry ... See more keywords
Spectroscopic imaging ellipsometry of self-assembled SiGe/Si nanostructures
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2016.10.123
Abstract: Abstract Spectroscopic imaging ellipsometry is used to characterize films containing self-assembled SiGe/Si in-plane nanowires grown by molecular beam epitaxy on a Si(001) substrate. The spatial resolution of the order of ∼1 μm allows to study individual… read more here.
Keywords: ellipsometry; spectroscopic imaging; assembled sige; self assembled ... See more keywords
Infrared spectroscopic ellipsometry of micrometer-sized SiO 2 line gratings
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.04.118
Abstract: Abstract For the design and process control of periodic nano-structured surfaces spectroscopic ellipsometry is already established in the UV–VIS spectral regime. The objective of this work is to show the feasibility of spectroscopic ellipsometry in… read more here.
Keywords: ellipsometry; line gratings; micrometer sized; spectroscopic ellipsometry ... See more keywords
The optical properties of transferred graphene and the dielectrics grown on it obtained by ellipsometry
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.08.109
Abstract: Abstract Graphene layers grown by chemical vapour deposition (CVD) method and transferred from Cu-foils to the oxidized Si-substrates were investigated by spectroscopic ellipsometry (SE), Raman and X-Ray Photoelectron Spectroscopy (XPS) methods. The optical properties of… read more here.
Keywords: ellipsometry; graphene layers; properties transferred; optical properties ... See more keywords
Effects of annealing temperature, thickness and substrates on optical properties of m-plane ZnO films studied by photoluminescence and temperature dependent ellipsometry
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Alloys and Compounds"
DOI: 10.1016/j.jallcom.2020.156631
Abstract: Abstract A series of m-plane ZnO films grown on sapphire and Si substrates with different thicknesses (186–371 nm) and different annealing temperatures (150–200 °C) were studied in detail by comparing X-ray diffraction, photoluminescence and spectroscopic ellipsometry measurements.… read more here.
Keywords: ellipsometry; temperature; plane zno; photoluminescence ... See more keywords
In situ magneto-optical ellipsometry data analysis for films growth control
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Magnetism and Magnetic Materials"
DOI: 10.1016/j.jmmm.2016.12.050
Abstract: Abstract In this work we present the way of ferromagnetic films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra for real time growth control is described. The method… read more here.
Keywords: ellipsometry; growth control; situ magneto; magneto optical ... See more keywords
Electron Beam Infrared Nano-Ellipsometry of Individual Indium Tin Oxide Nanocrystals.
Sign Up to like & getrecommendations! Published in 2020 at "Nano letters"
DOI: 10.1021/acs.nanolett.0c02772
Abstract: Leveraging recent advances in electron energy monochromation and aberration correction we record the spatially-resolved infrared plasmon spectrum of individual tin-doped indium oxide nanocrystals using electron energy-loss spectroscopy (EELS). Both surface and bulk plasmon responses are… read more here.
Keywords: ellipsometry; beam infrared; tin; oxide nanocrystals ... See more keywords
In Operando Spectroscopic Ellipsometry Investigation of MOF Thin Films for the Selective Capture of Acetic Acid.
Sign Up to like & getrecommendations! Published in 2023 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.2c17682
Abstract: The emission of polar volatile organic compounds (VOCs) is a major worldwide concern of air quality and equally impacts the preservation of cultural heritage (CH). The challenge is to design highly efficient adsorbents able to… read more here.
Keywords: adsorption; ellipsometry; selective capture; thin films ... See more keywords
Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry
Sign Up to like & getrecommendations! Published in 2022 at "ACS Nano"
DOI: 10.1021/acsnano.2c12773
Abstract: As performance of van der Waals heterostructure devices is governed by the nanoscale thicknesses and homogeneity of their constituent mono- to few-layer flakes, accurate mapping of these properties with high lateral resolution becomes imperative. Spectroscopic… read more here.
Keywords: fourier imaging; van der; ellipsometry; thickness mapping ... See more keywords
Surface Phonon Polariton Ellipsometry
Sign Up to like & getrecommendations! Published in 2024 at "ACS Photonics"
DOI: 10.1021/acsphotonics.4c01790
Abstract: Surface phonon polaritons (SPhPs) have become a key ingredient for infrared nanophotonics, owing to their long lifetimes and the large number of polar dielectric crystals supporting them. While these evanescent modes have been thoroughly characterized… read more here.
Keywords: field; surface phonon; phonon polariton; ellipsometry ... See more keywords
Crystallographic orientation of orthorhombic aragonite using reflection generalized ellipsometry
Sign Up to like & getrecommendations! Published in 2019 at "Journal of Applied Physics"
DOI: 10.1063/1.5109093
Abstract: The 2-modulator generalized ellipsometry microscope (2-MGEM) has been used to study a natural crystal of aragonite. Like its polymorph calcite, aragonite has a large refractive index difference between light polarized parallel to the c-axis and… read more here.
Keywords: ellipsometry; light polarized; surface; generalized ellipsometry ... See more keywords