Spectroscopic Ellipsometry of Asphalt Binder: A Study of Optical Constants
Sign Up to like & getrecommendations! Published in 2019 at "International Journal of Civil Engineering"
DOI: 10.1007/s40999-019-00468-5
Abstract: Spectroscopic ellipsometry is a powerful technique for determining optical properties of any thin surface. A method for characterizing optical properties of warm asphalt binder using spectroscopic ellipsometry along with associated results has been presented in… read more here.
Keywords: coefficient; ellipsometry; asphalt binder; spectroscopic ellipsometry ... See more keywords
Spectroscopic imaging ellipsometry of self-assembled SiGe/Si nanostructures
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2016.10.123
Abstract: Abstract Spectroscopic imaging ellipsometry is used to characterize films containing self-assembled SiGe/Si in-plane nanowires grown by molecular beam epitaxy on a Si(001) substrate. The spatial resolution of the order of ∼1 μm allows to study individual… read more here.
Keywords: ellipsometry; spectroscopic imaging; assembled sige; self assembled ... See more keywords
Infrared spectroscopic ellipsometry of micrometer-sized SiO 2 line gratings
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.04.118
Abstract: Abstract For the design and process control of periodic nano-structured surfaces spectroscopic ellipsometry is already established in the UV–VIS spectral regime. The objective of this work is to show the feasibility of spectroscopic ellipsometry in… read more here.
Keywords: ellipsometry; line gratings; micrometer sized; spectroscopic ellipsometry ... See more keywords
The optical properties of transferred graphene and the dielectrics grown on it obtained by ellipsometry
Sign Up to like & getrecommendations! Published in 2017 at "Applied Surface Science"
DOI: 10.1016/j.apsusc.2017.08.109
Abstract: Abstract Graphene layers grown by chemical vapour deposition (CVD) method and transferred from Cu-foils to the oxidized Si-substrates were investigated by spectroscopic ellipsometry (SE), Raman and X-Ray Photoelectron Spectroscopy (XPS) methods. The optical properties of… read more here.
Keywords: ellipsometry; graphene layers; properties transferred; optical properties ... See more keywords
Effects of annealing temperature, thickness and substrates on optical properties of m-plane ZnO films studied by photoluminescence and temperature dependent ellipsometry
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Alloys and Compounds"
DOI: 10.1016/j.jallcom.2020.156631
Abstract: Abstract A series of m-plane ZnO films grown on sapphire and Si substrates with different thicknesses (186–371 nm) and different annealing temperatures (150–200 °C) were studied in detail by comparing X-ray diffraction, photoluminescence and spectroscopic ellipsometry measurements.… read more here.
Keywords: ellipsometry; temperature; plane zno; photoluminescence ... See more keywords
In situ magneto-optical ellipsometry data analysis for films growth control
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Magnetism and Magnetic Materials"
DOI: 10.1016/j.jmmm.2016.12.050
Abstract: Abstract In this work we present the way of ferromagnetic films study by means of magneto-ellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra for real time growth control is described. The method… read more here.
Keywords: ellipsometry; growth control; situ magneto; magneto optical ... See more keywords
Electron Beam Infrared Nano-Ellipsometry of Individual Indium Tin Oxide Nanocrystals.
Sign Up to like & getrecommendations! Published in 2020 at "Nano letters"
DOI: 10.1021/acs.nanolett.0c02772
Abstract: Leveraging recent advances in electron energy monochromation and aberration correction we record the spatially-resolved infrared plasmon spectrum of individual tin-doped indium oxide nanocrystals using electron energy-loss spectroscopy (EELS). Both surface and bulk plasmon responses are… read more here.
Keywords: ellipsometry; beam infrared; tin; oxide nanocrystals ... See more keywords
In Operando Spectroscopic Ellipsometry Investigation of MOF Thin Films for the Selective Capture of Acetic Acid.
Sign Up to like & getrecommendations! Published in 2023 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.2c17682
Abstract: The emission of polar volatile organic compounds (VOCs) is a major worldwide concern of air quality and equally impacts the preservation of cultural heritage (CH). The challenge is to design highly efficient adsorbents able to… read more here.
Keywords: adsorption; ellipsometry; selective capture; thin films ... See more keywords
Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry
Sign Up to like & getrecommendations! Published in 2022 at "ACS Nano"
DOI: 10.1021/acsnano.2c12773
Abstract: As performance of van der Waals heterostructure devices is governed by the nanoscale thicknesses and homogeneity of their constituent mono- to few-layer flakes, accurate mapping of these properties with high lateral resolution becomes imperative. Spectroscopic… read more here.
Keywords: fourier imaging; van der; ellipsometry; thickness mapping ... See more keywords
Crystallographic orientation of orthorhombic aragonite using reflection generalized ellipsometry
Sign Up to like & getrecommendations! Published in 2019 at "Journal of Applied Physics"
DOI: 10.1063/1.5109093
Abstract: The 2-modulator generalized ellipsometry microscope (2-MGEM) has been used to study a natural crystal of aragonite. Like its polymorph calcite, aragonite has a large refractive index difference between light polarized parallel to the c-axis and… read more here.
Keywords: ellipsometry; light polarized; surface; generalized ellipsometry ... See more keywords
Double-sided and single-sided polished 6H-SiC wafers with subsurface damage layer studied by Mueller matrix ellipsometry
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Applied Physics"
DOI: 10.1063/5.0026124
Abstract: The complex optical constants and the subsurface damage layer of uniaxial doped 6H-SiC wafers are measured using Mueller matrix spectroscopic ellipsometry. A comparison is made between measurements on a single-sided polished wafer that can be… read more here.
Keywords: single sided; ellipsometry; subsurface damage; damage layer ... See more keywords