Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials
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DOI: 10.1016/j.apsusc.2016.10.158
Abstract: Abstract Spectroscopic imaging ellipsometry (SIE) is used to localize and characterize flakes of conducting, semi-conducting and insulating 2D-materials. Although the research in the field of monolayers of 2D-materials increased the last years, it is still… read more here.
Keywords: spectroscopic imaging; ellipsometry automated; automated search; search flakes ... See more keywords